Stress-Induced Phenomena in Metallization

Stress-Induced Phenomena in Metallization Ninth International Workshop on Stress-induced Phenomena in Metallization niet bekend

The conference was on reliability related science in ULSI interconnect. Its main purpose was to discuss the stress induced phenomena in the LSI interconnect among academic researchers and industry engineers to establish academic science and to improve the reliability of ULSI chips. All papers were peer reviewed.
€100,95

Deze titel is momenteel niet te bestellen.

Specificaties

Isbn
9780735404595
Uitgever
American Institute of Physics
Druk
1e
Verschenen
01-01-2007
Taal
Engels
Bladzijden
212 pp.
Bindwijze
Hardcover

Delen op

Meer op Athenaeum.nl over boeken

Koop uw boeken bij Athenaeum

  • Gratis verzending vanaf € 20,- (in de algemene webwinkel, binnen Nederland).
  • Vertrouwde service, veilige afhandeling
MINDBOOKSATH : athenaeum